Averaging Dynamic Element Matching Architectures for R-2R Digital-to-Analog Converters

Thanks to their simplicity and scalability, R-2R DACs find widespread employment in present-day applications of integrated circuits, including miniaturized sensing devices and other emerging contexts. However, they typically yield limited accuracy due to mismatch errors. To tackle this issue, two dynamic element matching (DEM) techniques, customized for R-2R DACs, are herein proposed, trading off operating frequency with accuracy. Statistical behavioural simulations have been performed to compare the presented approaches, highlighting comparable performances, with reductions of the standard deviation of INL down to a factor of 0.26. Thereby, design guidelines for optimized DEM-compensated R-2R DACs are suggested.