A High-Sensitivity and Wide-Dynamic-Range Image Sensor with Extended-Silicon Responsive Spectrum from 254 nm to 1310 nm
The spectral response of silicon-based CMOS image sensors has been limited from 300 nm (UVB) to 1100 nm (NIR) with a non-uniform external quantum efficiency (EQE). Breaking through this limitation can push Si-based image sensors towards broader-band applications such as secure surveillance and scientific instrumentation. Here, we propose a silicon-based image sensor with a five-transistor active pixel sensor (5T-APS) design that is based upon an embedded photodiode-body-biased MOSFET (PD-MOS), achieving an EQE of 639 % at 254 nm and 154 % at 1310 nm, and a wide dynamic range of over 120 dB. Furthermore, we have developed a readout circuit, and a compact hardware system that works for the 5T-APS pixel arrays.
Authors
- Yihong Qi (ORCID: https://orcid.org/0000-0001-9702-6642)
- Xingcheng Liu (ORCID: https://orcid.org/0000-0003-1836-2205)
- Tao Ma (ORCID: https://orcid.org/0000-0001-8101-3046)
- Kai Wang (ORCID: https://orcid.org/0000-0003-2006-5760)
- Zhou Zhou (ORCID: https://orcid.org/0000-0002-5645-7961)
- Chao Gao (ORCID: https://orcid.org/0009-0009-4031-004X)
- Xin Jin (ORCID: https://orcid.org/0000-0002-1311-1848)
Institutions
- Sun Yat-sen University (CN)
Publication Details
- Published
- 2025-05-25
- DOI
- https://doi.org/10.1109/iscas56072.2025.11044174
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Research and Development