Multi-Level Analog Computing-In-Memory FeFET-based Unit Cell for Deep Learning

This paper shows a FeFET-based analog multi-level unit cell for computing-in-memory applications for Deep Neural Networks (DNN). The FeFET-based unit cell performs input-weight multiplication with a Back-End-Of-Line (BEOL) ferro-electric HZO FeFET device on top of standard 180 nm CMOS circuits. The unit cell works with a feedback mechanism which combines an in-house FeFET device to store weights and CMOS transistors underneath to provide outputs in current mode to be integrated over time on a capacitor. Said feedback mechanism compensates for device-to-device variability, and would permit to calibrate a system against time variations, something not usually included in cross-bar solutions. Joint electrical simulations of the FeFET-CMOS circuit are performed with a compact Verilog-A model extracted from the experimental characterization of the FeFET devices. Electrical simulations show that our feedback approach leads to a multi-bit cell with 5-bits of resolution, superior to that of state-of-the-art solutions.

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Publication Details

Published
2025-05-25
DOI
https://doi.org/10.1109/iscas56072.2025.11043743
Primary Topic
Ferroelectric and Negative Capacitance Devices
Type
article
Field-Weighted Citation Impact
0.00

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article

Multi-Level Analog Computing-In-Memory FeFET-based Unit Cell for Deep Learning

Pablo López, Lars‐Erik Wernersson, D. García-Lesta, D. Cabello et al.
Ferroelectric and Negative Capacitance Devices
article

Multi-Level Analog Computing-In-Memory FeFET-based Unit Cell for Deep Learning

Pablo López, Lars‐Erik Wernersson, D. García-Lesta, D. Cabello, Hannes Dahlberg, Ó. Pereira-Rial, V.M. Brea
article en

Abstract

This paper shows a FeFET-based analog multi-level unit cell for computing-in-memory applications for Deep Neural Networks (DNN). The FeFET-based unit cell performs input-weight multiplication with a Back-End-Of-Line (BEOL) ferro-electric HZO FeFET device on top of standard 180 nm CMOS circuits. The unit cell works with a feedback mechanism which combines an in-house FeFET device to store weights and CMOS transistors underneath to provide outputs in current mode to be integrated over time on a capacitor. Said feedback mechanism compensates for device-to-device variability, and would permit to calibrate a system against time variations, something not usually included in cross-bar solutions. Joint electrical simulations of the FeFET-CMOS circuit are performed with a compact Verilog-A model extracted from the experimental characterization of the FeFET devices. Electrical simulations show that our feedback approach leads to a multi-bit cell with 5-bits of resolution, superior to that of state-of-the-art solutions.

Lund University (SE), Universidade de Santiago de Compostela (ES)
Xunta de Galicia
Openalex Percentile: Top 87%
Ferroelectric and Negative Capacitance Devices
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Multi-Level Analog Computing-In-Memory FeFET-based Unit Cell for Deep Learning — Pablo López, Lars‐Erik Wernersson, et al. · (2025) | TGRS Research Map | TGRS