Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment

This study investigated the thickness effect (the influence of sample thickness variation) on the assessment of the dielectric breakdown strength in XLPE and PP insulators. A Monte Carlo simulation (MCS) was conducted to quantify the impact of voltage and thickness on the dielectric strength. Aimed at improving power system reliability, the study sought to provide a quantitative basis for the thickness effect and propose a reasonable range of thickness variation, specifically between 0.2 mm and 1.1 mm. The simulation was repeated 1,000 times by modeling thickness deviations ranging from 1% to 10%. Levene’s test was used to assess the homogeneity of variance between an ideal group with a 1% thickness deviation and comparison groups with larger deviations. The proportion of cases where Levene’s test produced a p-value below the significance level reduced below 80% when the thickness variation exceeded 2.5%. This verified that the variance differences were statistically significant. This result (particularly for samples with thicknesses of at most 1 mm) provides a scientific basis for establishing tolerance standards for thickness variation. Thereby, it contributes to enhancing the reliability of dielectric strength testing methods.

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Publication Details

Journal
IEEE Access
Published
2025-01-01
DOI
https://doi.org/10.1109/access.2025.3583892
Primary Topic
High voltage insulation and dielectric phenomena
Type
article
Field-Weighted Citation Impact
0.00

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article

Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment

Keonhee Park, Jangseob Lim, Hae-Jong Kim, Seung-Won Lee
IEEE Access
High voltage insulation and dielectric phenomena
article

Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment

Keonhee Park, Jangseob Lim, Hae-Jong Kim, Seung-Won Lee
article en

Abstract

This study investigated the thickness effect (the influence of sample thickness variation) on the assessment of the dielectric breakdown strength in XLPE and PP insulators. A Monte Carlo simulation (MCS) was conducted to quantify the impact of voltage and thickness on the dielectric strength. Aimed at improving power system reliability, the study sought to provide a quantitative basis for the thickness effect and propose a reasonable range of thickness variation, specifically between 0.2 mm and 1.1 mm. The simulation was repeated 1,000 times by modeling thickness deviations ranging from 1% to 10%. Levene’s test was used to assess the homogeneity of variance between an ideal group with a 1% thickness deviation and comparison groups with larger deviations. The proportion of cases where Levene’s test produced a p-value below the significance level reduced below 80% when the thickness variation exceeded 2.5%. This verified that the variance differences were statistically significant. This result (particularly for samples with thicknesses of at most 1 mm) provides a scientific basis for establishing tolerance standards for thickness variation. Thereby, it contributes to enhancing the reliability of dielectric strength testing methods.

IEEE AccessVol. 13
Mokpo National Maritime University (KR), Korea Electrotechnology Research Institute (KR)
Ministry of Science and ICT, South Korea
Openalex Percentile: Top 89%
High voltage insulation and dielectric phenomena
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Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment — Keonhee Park, Jangseob Lim, et al. · IEEE Access (2025) | TGRS Research Map | TGRS