Open-Source Circuit Radiation Effects (OSCRE) Simulation Framework: Design and Applications

This paper presents the design and applications of the Open-Source Circuit Radiation Effects (OSCRE) simulation framework. The framework addresses the challenges of simulating radiation effects in integrated circuits by providing a custom library of SPICE-compatible radiation simulation cells and a user-friendly interface based on open-source EDA tools. The radiation library can be easily configured by the circuit designer to model different behaviors of single-event effects (SEE) in a circuit, including double exponential, dual double exponential, and adaptive double exponential effects. We demonstrate the effectiveness and utility of OSCRE to simulate radiation effects in two example circuits: an SRAM cell and an op amp.