Variation-Adaptive Negative Bitline and Skip Bitline Pre-charge Scheme for Low-Power SRAM
The negative bitline (NBL) write assist circuitry is widely adopted in static random access memory (SRAM) for its significant improvement in write yield and acceptable cost. Due to PVT variations and the trade-offs between yield and energy in different applications, the adaptive configuration of NBL enable timing and negative voltage level is increasingly essential, while existing NBL schemes lack a comprehensive methodology to adjust NBL options effectively. This paper presents a PVT variation-adaptive NBL (VA-NBL) write assist scheme and skip bitline pre-charge (SBP) circuitry for low-power SRAM. The VA-NBL scheme establishes a mapping relationship between NBL options and PVT conditions and employs on-chip PVT sensors to adaptively control NBL options, ensuring the lowest power consumption and satisfying target yield under PVT variations. Applied in a 64kb SRAM macro, we achieved different optimal NBL options under various PVT conditions, resulting in a maximum write energy power savings of 47%, while introducing negligible area overhead on dynamic voltage frequency scaling (DVFS) systems that already integrate PVT sensors. Additionally, the SBP circuitry for hierarchical bitline architecture avoids unnecessary pre-charge for write operations and further yields a 53% reduction in write energy.
Authors
- Yiran Zhang (ORCID: https://orcid.org/0000-0002-9554-6078)
- Weiwei Shan
- Changwei Yan
- Lishuo Deng (ORCID: https://orcid.org/0009-0009-2394-7663)
- Xin Si
Institutions
- Southeast University (CN)
Publication Details
- Published
- 2025-05-25
- DOI
- https://doi.org/10.1109/iscas56072.2025.11043894
- Primary Topic
- Low-power high-performance VLSI design
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China