Enabling Fault Isolation in Fault Injection for Automotive-grade Circuits Simulation

This paper proposes a method to enable fault isolation in non-intrusive fault injection at RTL and GL with a high-speed feature. The key scheme is to minimize the number of isolated modules inserted while maintaining the purity of the circuit source code called half-intrusive fault inject technique (HIFI). The proposed scheme integrates the advantages of intrusive and non-intrusive fault injection technique and enables fault isolation for the former. Simulation can be achieved by proposed HIFI with significantly 5× accelerated run-time than conventional intrusive technique. Besides, this work used this technique to build an open-source fault injection tool to help learners and researchers in the field of functional safety of integrate circuits.