Pressure‐Induced Metallization and Isostructural Transitions in 3R‐MoS<sub>2</sub>

At ambient conditions 3R-polytypes of transition metal dichalcogenides (TMDs) demonstrate fascinating properties because of their unique layer stacking. Understanding the structure-property relationship is essential for the realization of their use in spintronic, valleytronic, and optoelectronic applications. Herein, after the high pressure-temperature synthesis of 3R-MoS<sub>2</sub> in a large volume cubic press, a concomitant experimental and theoretical high-pressure study of 3R-MoS<sub>2</sub> is reported, leading to the discovery of pressure-induced reversible isostructural phase transitions without symmetry breaking. Concurrent with the isostructural transitions, a semiconductor-to-metal transition is observed, owing to strong interlayer interaction and charge redistribution across the van der Waals gap under pressure. The pressure-induced enhancement of interlayer interactions together with the robust intrinsic layer stacking in 3R-MoS<sub>2</sub> prevent the layers from sliding under pressure and hinder a corresponding volume collapse. This study on continuous pressure-tuning of crystal and electronic structure in 3R-MoS<sub>2</sub> will play a vital role in developing the next-generation devices involving coupling of structural, optical, and electrical properties of 3R-polytypes of TMDs and other layered materials.

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Publication Details

Journal
Advanced Science
Published
2025-06-27
DOI
https://doi.org/10.1002/advs.202505031
Citations
3
Primary Topic
2D Materials and Applications
Type
article
Field-Weighted Citation Impact
1.55

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article

Pressure‐Induced Metallization and Isostructural Transitions in 3R‐MoS2

Yusheng Zhao, Azkar Saeed Ahmad, Shanmin Wang, Elissaios Stavrou et al.
3 citations
Advanced Science
2D Materials and Applications
1.55
article

Pressure‐Induced Metallization and Isostructural Transitions in 3R‐MoS2

Yusheng Zhao, Azkar Saeed Ahmad, Shanmin Wang, Elissaios Stavrou, Mangladeep Bhullar, Yansun Yao, Kenny Ståhl, Konstantin V. Glazyrin, Taiyi Chen, Qian Zhang, Lei Feng, Martin Kunz, Wenting Lu, Xin Hu
article en
3 citations

Abstract

At ambient conditions 3R-polytypes of transition metal dichalcogenides (TMDs) demonstrate fascinating properties because of their unique layer stacking. Understanding the structure-property relationship is essential for the realization of their use in spintronic, valleytronic, and optoelectronic applications. Herein, after the high pressure-temperature synthesis of 3R-MoS<sub>2</sub> in a large volume cubic press, a concomitant experimental and theoretical high-pressure study of 3R-MoS<sub>2</sub> is reported, leading to the discovery of pressure-induced reversible isostructural phase transitions without symmetry breaking. Concurrent with the isostructural transitions, a semiconductor-to-metal transition is observed, owing to strong interlayer interaction and charge redistribution across the van der Waals gap under pressure. The pressure-induced enhancement of interlayer interactions together with the robust intrinsic layer stacking in 3R-MoS<sub>2</sub> prevent the layers from sliding under pressure and hinder a corresponding volume collapse. This study on continuous pressure-tuning of crystal and electronic structure in 3R-MoS<sub>2</sub> will play a vital role in developing the next-generation devices involving coupling of structural, optical, and electrical properties of 3R-polytypes of TMDs and other layered materials.

Advanced ScienceVol. 12(35)
Lawrence Berkeley National Laboratory (US), Technion – Israel Institute of Technology (IL), Deutsches Elektronen-Synchrotron DESY (DE), Southern University of Science and Technology (CN), University of Saskatchewan (CA), Guangdong Technion-Israel Institute of Technology (CN), Technical University of Denmark (DK)
U.S. Department of Energy, Technion-Israel Institute of Technology, Office of Science, Natural Sciences and Engineering Research Council of Canada, Deutsches Elektronen-Synchrotron
Openalex Percentile: Top 17%
2D Materials and Applications
1.55
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