Extraction of DK <sub>glass</sub> and DK <sub>resin</sub> for PCB Striplines and Analysis of Far-End Crosstalk
Far-end crosstalk (FEXT) in typical high-speed printed circuit board (PCB) striplines is primarily attributed to dielectric inhomogeneity. In this paper, the inhomogeneity problem is comprehensively addressed by a novel algorithm that characterizes the dielectric constants (DKs) of glass fibers and epoxy resin. In contrast to other methods, the proposed approach enables one to assess the impact of geometrical parameters on stripline FEXT and to estimate DK<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">core</sub> and DK<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">prepreg</sub> based on DK<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">glass</sub> and DK<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">resin</sub> values extracted through analytical expressions. Full-wave simulations and real-board measurements are conducted to verify the proposed approach.
Authors
- Xiaoning Ye (ORCID: https://orcid.org/0000-0002-1933-9210)
- Yuandong Guo (ORCID: https://orcid.org/0000-0002-5974-1976)
- DongHyun Kim (ORCID: https://orcid.org/0000-0003-2738-9549)
- Junyong Park (ORCID: https://orcid.org/0000-0002-0907-6680)
Institutions
- Intel (United States) (US)
- Missouri University of Science and Technology (US)
- Kyung Hee University (KR)
- Advanced Micro Devices (United States) (US)
- Dankook University (KR)
Publication Details
- Journal
- IEEE Transactions on Signal and Power Integrity
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tsipi.2025.3583657
- Primary Topic
- Material Properties and Processing
- Type
- article
- Field-Weighted Citation Impact
- 0.00