Single Event Effect Analysis of Complementary Full-Scale Dynamic Comparators

Based on a complementary full-scale comparator implemented in a 0.18μm process, a single-event transient current model was employed to simulate the effects of single-particle bombardment at the circuit level. A comprehensive single-event sensitivity analysis was conducted across the entire comparator circuit, and the internal sensitive nodes were identified and validated through simulation. The impact of single-event effects on the comparator's output under different operational states was systematically investigated, providing valuable insights and design guidelines for radiation-hardening strategies. This analysis offers a foundational framework for enhancing the radiation tolerance of the comparator and contributes to the development of robust integrated circuits for space applications.