Fabrication and Optical Characterization of Low-Loss Barium Titanate Waveguides

This paper presents low-loss monolithic Barium Titanium Oxide (BaTiO3), hereafter referred to as BTO, waveguides fabricated on a Silicon-on-insulator (SOI) platform, using a novel measurement approach based on optical back-scattering reflectometry (OBR). Utilizing this method, a low average propagation loss of 0.7 dB/cm was achieved for a straight waveguide which, to our knowledge, is the lowest propagation loss reported to date based on long BTO ridge-waveguides. Atomic force microscopy (AFM) and scanning electron microscopy (SEM) highlight the smooth sidewalls responsible for lowering the waveguide loss. Design simulations and fabrication processes are presented, followed by optical characterization.

Authors

Institutions

Publication Details

Journal
IEEE Photonics Technology Letters
Published
2025-06-24
DOI
https://doi.org/10.1109/lpt.2025.3582846
Primary Topic
Photonic and Optical Devices
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Fabrication and Optical Characterization of Low-Loss Barium Titanate Waveguides

Garrett J. Schneider, Shouyuan Shi, Dennis W. Prather, M. Ifaz Ahmad Isti et al.
IEEE Photonics Technology Letters
Photonic and Optical Devices
article

Fabrication and Optical Characterization of Low-Loss Barium Titanate Waveguides

Garrett J. Schneider, Shouyuan Shi, Dennis W. Prather, M. Ifaz Ahmad Isti, Zhu Xiaofeng, Peng Yao, Mohammad Jobayer Hossain, Marco Moller de Freitas
article en

Abstract

This paper presents low-loss monolithic Barium Titanium Oxide (BaTiO3), hereafter referred to as BTO, waveguides fabricated on a Silicon-on-insulator (SOI) platform, using a novel measurement approach based on optical back-scattering reflectometry (OBR). Utilizing this method, a low average propagation loss of 0.7 dB/cm was achieved for a straight waveguide which, to our knowledge, is the lowest propagation loss reported to date based on long BTO ridge-waveguides. Atomic force microscopy (AFM) and scanning electron microscopy (SEM) highlight the smooth sidewalls responsible for lowering the waveguide loss. Design simulations and fabrication processes are presented, followed by optical characterization.

IEEE Photonics Technology LettersVol. 37(19)
Phase Sensitive Innovations (United States) (US), University of Delaware (US)
Office of Naval Research, Air Force Office of Scientific Research
Openalex Percentile: Top 87%
Photonic and Optical Devices
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.