Distribution analysis in xCT data for identifying factors influencing uncertainty of repeated measurements

X-ray computed tomography (xCT) enables the measurement of inner and outer dimensional quantities by reconstructing the 3D model of an object. Due to limited understanding of the xCT acquisition and reconstruction processes modern guidelines typically estimate the measurement uncertainty using a standardized procedure based on repeated measurements and basic statistical analysis. In this work, we analyze voxel-wise distributions in the reconstructed volume and identifyclusters that reveal factors influencing measurement uncertainty in repeated measurements, with the eventual goal of reducing the number of CT scans required for accurate uncertainty estimation.