Parametric resonance with linear damping: a general formula for the excitation threshold for high orders

Abstract We derive a general formula for the excitation threshold of parametric resonances of an oscillator with linear damping from consideration of the asymptotic properties of the Mathieu equation. This provides a good approximation for resonances of order m ≥ 2, and it is especially useful for high-order resonances in systems with light damping for which other approaches are cumbersome. Parametric resonance is ubiquitous in mechanical and electrical systems and its threshold is an important consideration, e.g., for systems that would be damaged by a high amplitude of resonantly excited motion. We present the expressions in a form useful for understanding systems with high quality factors such as trapped atomic ions, micro-mechanical devices and other oscillators, especially those with low dissipation in vacuum. High-order parametric resonances are extremely narrow making direct numerical simulation computationally intensive as well as less insightful.

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Publication Details

Journal
Physica Scripta
Published
2025-06-24
DOI
https://doi.org/10.1088/1402-4896/ade7bb
Primary Topic
Force Microscopy Techniques and Applications
Type
article
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article

Parametric resonance with linear damping: a general formula for the excitation threshold for high orders

C. J. Foot, Dimitrios Trypogeorgos
Physica Scripta
Force Microscopy Techniques and Applications
article

Parametric resonance with linear damping: a general formula for the excitation threshold for high orders

C. J. Foot, Dimitrios Trypogeorgos
article en

Abstract

Abstract We derive a general formula for the excitation threshold of parametric resonances of an oscillator with linear damping from consideration of the asymptotic properties of the Mathieu equation. This provides a good approximation for resonances of order m ≥ 2, and it is especially useful for high-order resonances in systems with light damping for which other approaches are cumbersome. Parametric resonance is ubiquitous in mechanical and electrical systems and its threshold is an important consideration, e.g., for systems that would be damaged by a high amplitude of resonantly excited motion. We present the expressions in a form useful for understanding systems with high quality factors such as trapped atomic ions, micro-mechanical devices and other oscillators, especially those with low dissipation in vacuum. High-order parametric resonances are extremely narrow making direct numerical simulation computationally intensive as well as less insightful.

Physica ScriptaVol. 100(7)
Openalex Percentile: Top 89%
Force Microscopy Techniques and Applications
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