Multi-parameter detection of bond wire lift-off, current, and temperature in IGBT modules via gate voltage waveforms and CNNs with digital gate control

• Multi-parameter detection of emitter current, junction temperature, and wire lift-off level using gate voltage waveforms was investigated. • The digital gate control alters the detection sensitivity. • A CNN model can classify multiple parameters based on gate voltage waveforms. A new method for multi-parameter detection of bond wire lift-off, emitter current, and junction temperature using gate voltage waveforms and a convolutional neural network is proposed for the condition monitoring of power modules. This method was demonstrated to classify 80 levels for the full combination of various parameters. In addition, digital gate control (DGC) was utilized to improve not only the switching characteristics but also the detection accuracy. The experimental results show that the sensitivity of the gate voltage waveforms changed significantly due to the influence of the combined parameters. The detection accuracy depends on the control conditions of DGC, and optimized conditions achieved a high accuracy of over 96%, even for multi-parameter detection.

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Publication Details

Journal
Power Electronic Devices and Components
Published
2025-06-24
DOI
https://doi.org/10.1016/j.pedc.2025.100106
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

Multi-parameter detection of bond wire lift-off, current, and temperature in IGBT modules via gate voltage waveforms and CNNs with digital gate control

Makoto Takamiya, Thatree Mamee, Katsuhiro Hata, Wataru Saito et al.
Power Electronic Devices and Components
Silicon Carbide Semiconductor Technologies
article

Multi-parameter detection of bond wire lift-off, current, and temperature in IGBT modules via gate voltage waveforms and CNNs with digital gate control

Makoto Takamiya, Thatree Mamee, Katsuhiro Hata, Wataru Saito, Shin–ichi Nishizawa, Takayasu Sakurai
article en

Abstract

• Multi-parameter detection of emitter current, junction temperature, and wire lift-off level using gate voltage waveforms was investigated. • The digital gate control alters the detection sensitivity. • A CNN model can classify multiple parameters based on gate voltage waveforms. A new method for multi-parameter detection of bond wire lift-off, emitter current, and junction temperature using gate voltage waveforms and a convolutional neural network is proposed for the condition monitoring of power modules. This method was demonstrated to classify 80 levels for the full combination of various parameters. In addition, digital gate control (DGC) was utilized to improve not only the switching characteristics but also the detection accuracy. The experimental results show that the sensitivity of the gate voltage waveforms changed significantly due to the influence of the combined parameters. The detection accuracy depends on the control conditions of DGC, and optimized conditions achieved a high accuracy of over 96%, even for multi-parameter detection.

Power Electronic Devices and ComponentsVol. 12
Kyushu University (JP), Shibaura Institute of Technology (JP), The University of Tokyo (JP)
New Energy and Industrial Technology Development Organization
Affordable and clean energy
Openalex Percentile: Top 87%
Silicon Carbide Semiconductor Technologies
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Multi-parameter detection of bond wire lift-off, current, and temperature in IGBT modules via gate voltage waveforms and CNNs with digital gate control — Makoto Takamiya, Thatree Mamee, et al. · Power Electronic Devices and Components (2025) | TGRS Research Map | TGRS