Effect of Aluminum Target Manufacturing Process on the Structural and Electrical Properties of Thin Film for DC Magnetron Sputtering

This study compares the properties of aluminum targets manufactured through casting, rolling, and extrusion processes, examining thin films produced via DC magnetron sputtering using each target. Despite minimal differences in density, electrical conductivity, and resistivity among the targets, the extrusion target exhibited higher internal deformation energy than the casting and rolling targets. Thin films fabricated from each target showed similar grain sizes and deposition rates. However, thin films produced using the extrusion target demonstrated a higher frequency of hillock formations and displayed resistivity values approximately 1.5 µΩ-cm higher than those produced with other targets.

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Publication Details

Journal
MATERIALS TRANSACTIONS
Published
2025-06-24
DOI
https://doi.org/10.2320/matertrans.mt-mb2024013
Primary Topic
Metal and Thin Film Mechanics
Type
article
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article

Effect of Aluminum Target Manufacturing Process on the Structural and Electrical Properties of Thin Film for DC Magnetron Sputtering

Young-Kyun Kim, Jung Joon Kim, Sang-Min Yoon
MATERIALS TRANSACTIONS
Metal and Thin Film Mechanics
article

Effect of Aluminum Target Manufacturing Process on the Structural and Electrical Properties of Thin Film for DC Magnetron Sputtering

Young-Kyun Kim, Jung Joon Kim, Sang-Min Yoon
article en

Abstract

This study compares the properties of aluminum targets manufactured through casting, rolling, and extrusion processes, examining thin films produced via DC magnetron sputtering using each target. Despite minimal differences in density, electrical conductivity, and resistivity among the targets, the extrusion target exhibited higher internal deformation energy than the casting and rolling targets. Thin films fabricated from each target showed similar grain sizes and deposition rates. However, thin films produced using the extrusion target demonstrated a higher frequency of hillock formations and displayed resistivity values approximately 1.5 µΩ-cm higher than those produced with other targets.

MATERIALS TRANSACTIONSVol. 66(7)
Institute for Advanced Engineering (KR)
Openalex Percentile: Top 84%
Metal and Thin Film Mechanics
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