Predictive Modeling for Critical Defects Using CNN-Random Forest Fusion
In the end, identifying and resolving major faults is crucial in modern manufacturing to ensure the creation of excellent, dependable products. The present article provides a complete review of the identification of important flaws utilizing a new method that blends convolution neural networks (CNNs) and Random Forest algorithms. The examination looks for cracks, delamination, permeability, inclusions, dimension deviations, cosmetic flaws, weld imperfections, corrosion, electrical briefs, or leaking. The suggested model works remarkably well over an extensive variety of key fault types. Precision, Recall, and F1-Score measurements demonstrate the model's ability to accurately detect instances for every defect type with high accuracy as well as recall. Detecting and eliminating severe faults is essential in contemporary manufacturing to ensure the production of high-quality and reliable products. The present paper provides a complete investigation of the detection of significant flaws using a novel method that integrates convolutional neural network networks (CNNs) and Random Forest algorithms. The examination looks for a variety of flaws, including fractured bones, delamination, porosity, particulates, dimension deviations, aesthetic inconsistencies, soldering errors, corrosion, electrical shorts, and leaking. The suggested approach works remarkably across a wide range of important problem types. Precision, recall, and F1-Score measurements demonstrate the model's ability to properly detect instances of every defect type using excellent precision and recall. Furthermore, the investigation highlights the precision of the model, which achieved an incredible 99%, indicating its ability to make correct predictions across a wide range of defect categories. The Support Percentage statistic provides important context by providing the proportional prevalence of each defect class within the data collection, allowing for an additional nuanced evaluation of the model's generalization skills. The paper extends the detection of defects methodologies used for production by presenting a powerful yet customizable model.
Authors
- Neha Sharma (ORCID: https://orcid.org/0000-0001-5103-6570)
- Priyanshi Aggarwal
- Deepak Banerjee (ORCID: https://orcid.org/0009-0006-7416-2047)
- Mukesh Singh
Institutions
- Graphic Era University (IN)
- Chitkara University (IN)
Publication Details
- Published
- 2024-08-10
- DOI
- https://doi.org/10.1109/iccccm61016.2024.11039993
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00