Study on the Displacement-Total Ionizing Dose Synergistic Effect of UC1825 Pulse Width Modulator

This research focuses on the displacement - total ionizing dose synergistic effect of the UC1825 PWM under neutron and gamma ray irradiation. After irradiating with 2×10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">12</sup> n/cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> (the equivalent fluence of 1MeV neutrons) and gamma ray, it's found that neutron irradiation reduces the device's total ionizing dose tolerance. Geant4 simulations reveal that the increase in the density of oxide trap charges caused by oxygen atom displacement is the key factor in this synergistic effect. Moreover, the impact of low - energy neutrons should not be underestimated. In harsh radiation environments, it is necessary to choose more radiation - resistant PWM devices and appropriately increase the radiation design margins.

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Publication Details

Published
2025-04-16
DOI
https://doi.org/10.1109/icreed65908.2025.11036229
Primary Topic
Radiation Detection and Scintillator Technologies
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article
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article

Study on the Displacement-Total Ionizing Dose Synergistic Effect of UC1825 Pulse Width Modulator

Zhen Lv, Sihan Wang, Lindong Ma, Xiang Zhang et al.
Radiation Detection and Scintillator Technologies
article

Study on the Displacement-Total Ionizing Dose Synergistic Effect of UC1825 Pulse Width Modulator

Zhen Lv, Sihan Wang, Lindong Ma, Xiang Zhang, Hua Zhang, Yiyuan Wang, Zhiming Zhao
article en

Abstract

This research focuses on the displacement - total ionizing dose synergistic effect of the UC1825 PWM under neutron and gamma ray irradiation. After irradiating with 2×10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">12</sup> n/cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> (the equivalent fluence of 1MeV neutrons) and gamma ray, it's found that neutron irradiation reduces the device's total ionizing dose tolerance. Geant4 simulations reveal that the increase in the density of oxide trap charges caused by oxygen atom displacement is the key factor in this synergistic effect. Moreover, the impact of low - energy neutrons should not be underestimated. In harsh radiation environments, it is necessary to choose more radiation - resistant PWM devices and appropriately increase the radiation design margins.

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Study on the Displacement-Total Ionizing Dose Synergistic Effect of UC1825 Pulse Width Modulator — Zhen Lv, Sihan Wang, et al. · (2025) | TGRS Research Map | TGRS