Total Ionizing Dose Effect on Voltage Controlled Ring Oscillator in 65nm CMOS
This work examines total ionizing dose response of the voltage-controlled ring oscillators based on differential delay cells (Lee-Kim, Maneatis) and current-starved inverters (single-end, cross-coupling, feedforward cross-coupling).
Authors
- Zheyi Li (ORCID: https://orcid.org/0000-0002-1740-1711)
- Paul Leroux (ORCID: https://orcid.org/0000-0002-1790-2428)
- Jinghao Zhao (ORCID: https://orcid.org/0000-0001-9631-8168)
- Qi Guo (ORCID: https://orcid.org/0000-0001-9700-1568)
- Xuefeng Yu (ORCID: https://orcid.org/0009-0002-7860-1247)
- Jeffrey Prinzie (ORCID: https://orcid.org/0000-0002-7303-985X)
Institutions
- Chinese Academy of Sciences (CN)
- Xinjiang Technical Institute of Physics & Chemistry (CN)
- KU Leuven (BE)
Publication Details
- Published
- 2025-04-16
- DOI
- https://doi.org/10.1109/icreed65908.2025.11036206
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00