A High-Resolution Algorithm for Extracting Time Constant Spectra Based on Frequency-Dependent Capacitance Measurements

The time constant spectrum is crucial for identifying displacement damage in semiconductor devices. Traditionally, time constant spectra are extracted using transient capacitance measurements, which demand stringent testing conditions. This paper proposes a high-resolution time constant spectrum extraction algorithm based on Bayesian deconvolution, utilizing simple frequency-dependent capacitance measurements. Using this method, the time constant spectra of InGaAs/InP heterojunctions before and after proton irradiation were successfully obtained. These results provide new insights into the gain degradation mechanism of InP/InGaAs heterojunction bipolar transistors following irradiation.