SEE Characterization of NOR Flash in Dynamic Operation Mode for Aerospace Application
We investigate single-event effect (SEE) of NOR Flash based on 55nm SONOS process in dynamic operation mode, and analyze the failure mechanisms of single-event functional interruption (SEFI), single-event upset (SEU) and other typical phenomena. With analysis of customized circuits, we point out sensitive circuit modules and effective radiation-hardened design.
Authors
- Qichao Zha
- Lei Chen (ORCID: https://orcid.org/0000-0002-4778-4688)
- Yimao Cai (ORCID: https://orcid.org/0000-0002-6854-8211)
- Ling Qi (ORCID: https://orcid.org/0000-0001-6657-1226)
- Wei Cao (ORCID: https://orcid.org/0009-0002-4291-4970)
- Xin Li (ORCID: https://orcid.org/0000-0002-9791-5105)
- Jiancheng Li (ORCID: https://orcid.org/0000-0003-3708-2524)
- Fubang An
Institutions
- Peking University (CN)
- Beijing Microelectronics Technology Institute (CN)
Publication Details
- Published
- 2025-04-16
- DOI
- https://doi.org/10.1109/icreed65908.2025.11036216
- Primary Topic
- Ionosphere and magnetosphere dynamics
- Type
- article
- Field-Weighted Citation Impact
- 0.00