Exploration of 2D Test for SEE in PLL Devices

Aiming at the digital-analog hybrid circuit characteristics of PLL devices, explore the SEE test method of commercial integrated PLL device, and propose a 2D test method of synchronous monitoring and coupling analysis of digital and analog parameters inside the PLL. This method, compared with the traditional test and simulation methods, can quickly realize a comprehensive and accurate assessment of the SEE of commercial integrated PLL devices, provide a reference for their reinforcement applications, and promote the application of monolithic integrated PLL in low-cost commercial spaceflight.