Research on Low-Cost In-Orbit Error Rate Assessment Methods for Commercial Space
This study focuses on the commercial space sector, analyzing the radiation environment of typical orbits and the commonly used methodologies for estimating in-orbit error rates. It emphasizes that proton-induced single-event effects, particularly proton direct ionization, are critical factors impacting the long-term reliability and stable operation of commercial off-the-shelf electronic components. The study proposes a simplified approach for calculating the proton singleevent upset rate in orbit, which provides a robust technical framework for reliability assessment of commercial spacecraft operating in typical environments. Furthermore, this method reduces testing complexity and costs, thereby enhancing costeffectiveness and economic viability for commercial space missions.
Authors
- Tao Dong (ORCID: https://orcid.org/0000-0003-0555-2720)
- Sichong Huang (ORCID: https://orcid.org/0000-0002-8615-5534)
- Chunliang Gou
- Liang Wang (ORCID: https://orcid.org/0000-0002-0061-5502)
- Hongchao Zheng
- Xiao Fang Bi
Institutions
- Beijing Microelectronics Technology Institute (CN)
Publication Details
- Published
- 2025-04-16
- DOI
- https://doi.org/10.1109/icreed65908.2025.11036203
- Primary Topic
- Inertial Sensor and Navigation
- Type
- article
- Field-Weighted Citation Impact
- 0.00