Structure refinement and anisotropic atomic displacement parameters of 1M Illite: Rietveld and pair distribution function analysis using synchrotron X-ray radiation

Illite, a widespread clay mineral, plays a pivotal role in geological processes, notably as an indicator in diagenetic and hydro-thermal alteration environments, and possesses significant industrial relevance in applications including ceramics, construction and catalysis. However, challenges including its nanoscale crystallinity, structural disorder and frequent interstratification with other clay minerals have hindered detailed structural characterization using conventional X-ray diffraction (XRD) techniques. This study employs integrated synchrotron XRD and pair distribution function (PDF) analysis to elucidate the crystal structure of the 1M illite polytype, yielding the first determination of its anisotropic atomic displacement parameters (<i>U</i> <sub>aniso</sub>). These <i>U</i> <sub>aniso</sub> parameters provide critical insights into atomic dynamics and static disorder within the structure, enabling a more refined understanding of structure-property relationships. This integrated approach, combining synchrotron XRD, Rietveld refinement and PDF analysis, yields a comprehensive structural characterization, capturing both average crystallographic and local atomic arrangements. Considering illite's widespread geological occurrence and industrial importance, this high-precision structural dataset, especially the determined <i>U</i> <sub>aniso</sub> values, provides a crucial benchmark for future modeling and simulation efforts targeting accurate prediction of its physicochemical behavior.

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Journal
Journal of Applied Crystallography
Published
2025-06-12
DOI
https://doi.org/10.1107/s1600576725004170
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
0.00

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article

Structure refinement and anisotropic atomic displacement parameters of 1M Illite: Rietveld and pair distribution function analysis using synchrotron X-ray radiation

Seungyeol Lee
Journal of Applied Crystallography
X-ray Diffraction in Crystallography
article

Structure refinement and anisotropic atomic displacement parameters of 1M Illite: Rietveld and pair distribution function analysis using synchrotron X-ray radiation

Seungyeol Lee
article en

Abstract

Illite, a widespread clay mineral, plays a pivotal role in geological processes, notably as an indicator in diagenetic and hydro-thermal alteration environments, and possesses significant industrial relevance in applications including ceramics, construction and catalysis. However, challenges including its nanoscale crystallinity, structural disorder and frequent interstratification with other clay minerals have hindered detailed structural characterization using conventional X-ray diffraction (XRD) techniques. This study employs integrated synchrotron XRD and pair distribution function (PDF) analysis to elucidate the crystal structure of the 1M illite polytype, yielding the first determination of its anisotropic atomic displacement parameters (<i>U</i> <sub>aniso</sub>). These <i>U</i> <sub>aniso</sub> parameters provide critical insights into atomic dynamics and static disorder within the structure, enabling a more refined understanding of structure-property relationships. This integrated approach, combining synchrotron XRD, Rietveld refinement and PDF analysis, yields a comprehensive structural characterization, capturing both average crystallographic and local atomic arrangements. Considering illite's widespread geological occurrence and industrial importance, this high-precision structural dataset, especially the determined <i>U</i> <sub>aniso</sub> values, provides a crucial benchmark for future modeling and simulation efforts targeting accurate prediction of its physicochemical behavior.

Journal of Applied CrystallographyVol. 58(4)
Chungbuk National University (KR)
U.S. Department of Energy, National Research Foundation, National Research Foundation of Korea, Ministry of Science and ICT, South Korea, Office of Science, Basic Energy Sciences
Openalex Percentile: Top 90%
X-ray Diffraction in Crystallography
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