A Bayesian Approach to Step-Stress Partially Accelerated Life Testing for a Novel Lifetime Distribution

In lifetime testing, the failure times of highly reliable products under normal usage conditions are often impractically long, making direct reliability assessment impractical. To overcome this, step-stress partially accelerated life testing is employed to reduce testing time while preserving data quality. This paper develops a Bayesian model based on Type II censored data, assuming that item lifetimes follow the Topp–Leone inverted Kumaraswamy distribution, a flexible alternative to classical lifetime models due to its ability to capture various hazard rate shapes and to model bounded and skewed lifetime data more effectively than traditional models observed in real-world reliability data. Bayes estimators of the model parameters and acceleration factor are derived under both symmetric (balanced squared error) and asymmetric (balanced linear exponential) loss functions using informative priors. The novelty of this work lies in the integration of the Topp–Leone inverted Kumaraswamy distribution within the Bayesian step-stress partially accelerated life testing framework, which has not been explored previously, offering improved modeling capability for complex lifetime data. The proposed method is validated through comprehensive simulation studies under various censoring schemes, demonstrating robustness and superior estimation performance compared to traditional models. A real-data application involving COVID-19 mortality data further illustrates the practical relevance and improved fit of the model. Overall, the results highlight the flexibility, efficiency, and applicability of the proposed Bayesian approach in reliability analysis.