High pressure structural and lattice dynamics study of <i>α</i>-In2Se3
Layered α-In2Se3 has been studied using a combined in situ synchrotron angle-dispersive powder x-ray diffraction and Raman spectroscopy study in a diamond anvil cell up to 60+ GPa, at room temperature. Helium, which remains fairly hydrostatic up to the highest pressure in this study, was used as the pressure-transmitting medium. The results from both experimental methods reveal a pressure-induced structural phase transition from α-In2Se3 to a monoclinic β'-In2Se3 structure at ≈1 GPa, in agreement with previous studies. Based on our detailed measurements using both experimental techniques and the F-f formalism, the β'-In2Se3 structure remains stable up to 45 GPa, without a clear indication of a phase transition toward the previously reported β-In2Se3 phase. Above this pressure, In2Se3 adopts a disordered solid-solution-like orthorhombic structure, phase IV. The results are discussed in comparison with the relevant previous studies of α-In2Se3 under pressure.
Authors
- Elad Koren (ORCID: https://orcid.org/0000-0001-7437-7124)
- Azkar Saeed Ahmad (ORCID: https://orcid.org/0000-0002-0046-8100)
- Elissaios Stavrou (ORCID: https://orcid.org/0000-0001-5212-4927)
- Hirokazu Kadobayashi (ORCID: https://orcid.org/0000-0001-7361-0836)
- Baihong Sun
- Bihan Wang (ORCID: https://orcid.org/0000-0002-1223-503X)
- Martin Kunz (ORCID: https://orcid.org/0000-0001-9769-9900)
- Qian Zhang (ORCID: https://orcid.org/0000-0002-2757-2557)
- Hua Zou (ORCID: https://orcid.org/0000-0002-5292-3988)
- Chenxin Wei
- Wenting Lu (ORCID: https://orcid.org/0009-0009-9272-5693)
- Shiyu Feng
Institutions
- Lawrence Berkeley National Laboratory (US)
- Technion – Israel Institute of Technology (IL)
- Deutsches Elektronen-Synchrotron DESY (DE)
- Japan Synchrotron Radiation Research Institute (JP)
Publication Details
- Journal
- The Journal of Chemical Physics
- Published
- 2025-06-18
- DOI
- https://doi.org/10.1063/5.0266372
- Citations
- 1
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.73