Implementation of the Adaptive Testing Scheme Based on the General-purpose Automated Test Equipment (ATE) Platform

This paper presents an adaptive testing scheme for the NCA9555 chip using the QSTAR ATE tester by Sandtek, widely used in IC package and test. The scheme features adaptive test item management, dynamic range adjustment, and flexible parallel testing station selection to enhance efficiency, reduce costs, and improve test controllability. The developed solution is practical and directly applicable for industrial mass production.