An Easy-Driving Incremental Zoom ADC With Skipped Sampling Scheme and NS-SAR Quantizer

This article presents an incremental zoom analog-to-digital converter (ADC) for Internet-of-Things (IoT) applications. Unlike prior zoom ADC designs, a floating inverter amplifier (FIA)-assisted residue extraction scheme is proposed to maintain the residue voltage during loop filtering. It allows the ADC to skip repeated sampling operations between consecutive fine conversions, thus largely reducing the sampling time and driving cost. To speed up the conversion, a high-efficiency second-order single buffer embedded noise-shaping (NS) successive approximation register (SAR) is proposed as the fine quantizer, allowing a low conversion cycle of 32. Together with the amplifier-reused kT/C noise cancellation technique, the prototype ADC fabricated in a 28-nm CMOS realizes a 92.5-dB SNDR at 300 kS/s with a small input capacitor of 0.8 pF. With fully dynamic operation, the power consumption is only <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$160~{\mu}$</tex-math> </inline-formula>W, leading to a superior Schreier figure of merit (FoM) of 182.2 dB.

Authors

Institutions

Publication Details

Journal
IEEE Journal of Solid-State Circuits
Published
2025-06-18
DOI
https://doi.org/10.1109/jssc.2025.3576663
Primary Topic
CCD and CMOS Imaging Sensors
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

An Easy-Driving Incremental Zoom ADC With Skipped Sampling Scheme and NS-SAR Quantizer

Yuan Wang, Zichen Kong, Lu Jie, Mingtao Zhan et al.
IEEE Journal of Solid-State Circuits
CCD and CMOS Imaging Sensors
article

An Easy-Driving Incremental Zoom ADC With Skipped Sampling Scheme and NS-SAR Quantizer

Yuan Wang, Zichen Kong, Lu Jie, Mingtao Zhan, Zongnan Wang, Yi Zhong, Xiyuan Tang
article en

Abstract

This article presents an incremental zoom analog-to-digital converter (ADC) for Internet-of-Things (IoT) applications. Unlike prior zoom ADC designs, a floating inverter amplifier (FIA)-assisted residue extraction scheme is proposed to maintain the residue voltage during loop filtering. It allows the ADC to skip repeated sampling operations between consecutive fine conversions, thus largely reducing the sampling time and driving cost. To speed up the conversion, a high-efficiency second-order single buffer embedded noise-shaping (NS) successive approximation register (SAR) is proposed as the fine quantizer, allowing a low conversion cycle of 32. Together with the amplifier-reused kT/C noise cancellation technique, the prototype ADC fabricated in a 28-nm CMOS realizes a 92.5-dB SNDR at 300 kS/s with a small input capacitor of 0.8 pF. With fully dynamic operation, the power consumption is only <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$160~{\mu}$</tex-math> </inline-formula>W, leading to a superior Schreier figure of merit (FoM) of 182.2 dB.

IEEE Journal of Solid-State CircuitsVol. 61(2)
Peking University (CN), Beijing Academy of Artificial Intelligence (CN), Tsinghua University (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 88%
CCD and CMOS Imaging Sensors
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

An Easy-Driving Incremental Zoom ADC With Skipped Sampling Scheme and NS-SAR Quantizer — Yuan Wang, Zichen Kong, et al. · IEEE Journal of Solid-State Circuits (2025) | TGRS Research Map | TGRS