Design And Verification of Low Power SRAM Memory Cells

As the demand for energy-efficient electronic devices continues to grow, the focus on low-power memory designs becomes paramount.Our Project presents a comprehensive study on the design and verification of low-power SRAM memory cells, addressing the critical need for energy-efficient memory solutions in contemporary electronic systems.The primary objective is to optimize SRAM cells for reduced power consumption while maintaining satisfactory performance and reliability.The basic 6T Static Random Access memory (SRAM) cell experience from relatively high static and total power loss problem, to solve this 4T SRAM cell is designed.As the technology is shrinking, a significant amount of attention is being paid on the design of high stability Static Random Access (SRAM) cells in terms of static Noise Margin (SNM) for different levels of cache memories.This project presents a qualitative design of 4T Static Random Memory Access cell in terms of Read cell current, Write time, Static Noise Margin (Read and Hold), Write Noise Margin in 45nm and 90nm CMOS technology.

Publication Details

Journal
IJARCCE
Published
2025-06-18
DOI
https://doi.org/10.17148/ijarcce.2025.14677
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
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article

Design And Verification of Low Power SRAM Memory Cells

IJARCCE
VLSI and Analog Circuit Testing
article

Design And Verification of Low Power SRAM Memory Cells

article en

Abstract

As the demand for energy-efficient electronic devices continues to grow, the focus on low-power memory designs becomes paramount.Our Project presents a comprehensive study on the design and verification of low-power SRAM memory cells, addressing the critical need for energy-efficient memory solutions in contemporary electronic systems.The primary objective is to optimize SRAM cells for reduced power consumption while maintaining satisfactory performance and reliability.The basic 6T Static Random Access memory (SRAM) cell experience from relatively high static and total power loss problem, to solve this 4T SRAM cell is designed.As the technology is shrinking, a significant amount of attention is being paid on the design of high stability Static Random Access (SRAM) cells in terms of static Noise Margin (SNM) for different levels of cache memories.This project presents a qualitative design of 4T Static Random Memory Access cell in terms of Read cell current, Write time, Static Noise Margin (Read and Hold), Write Noise Margin in 45nm and 90nm CMOS technology.

IJARCCEVol. 14(6)
Affordable and clean energy
Openalex Percentile: Top 87%
VLSI and Analog Circuit Testing
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Design And Verification of Low Power SRAM Memory Cells · IJARCCE (2025) | TGRS Research Map | TGRS