Branched HgTe Nanorods for Stable Room Temperature Extended Short-Wave Infrared Photodetectors

Single-element detectors (SEDs) with a room temperature extended short-wave infrared (eSWIR) photoresponse were fabricated with branched nanorods of HgTe. Nanorods with high aspect (length/width) ratios were obtained by using stoichiometric excesses of Hg (i.e., [Hg]/[Te] molar ratios greater than one) and relatively low reaction temperatures, as low as room temperature. The size-tunable optical cutoff wavelengths of the detectors ranged from 2 to 3.5 μm, with specific detectivities as high as 2.4 × 10<sup>11</sup> Jones. The devices retained their responsivity for more than a year. Branched nanorods of HgTe are promising materials for IR photodetectors and imagers.

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Publication Details

Journal
ACS Nano
Published
2025-06-17
DOI
https://doi.org/10.1021/acsnano.5c03657
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
Field-Weighted Citation Impact
0.00

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article

Branched HgTe Nanorods for Stable Room Temperature Extended Short-Wave Infrared Photodetectors

Brian A. Korgel, Jungchul Noh, Shea Sanvordenker, Richard E. Pimpinella et al.
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Branched HgTe Nanorods for Stable Room Temperature Extended Short-Wave Infrared Photodetectors

Brian A. Korgel, Jungchul Noh, Shea Sanvordenker, Richard E. Pimpinella, J. Howell
article en

Abstract

Single-element detectors (SEDs) with a room temperature extended short-wave infrared (eSWIR) photoresponse were fabricated with branched nanorods of HgTe. Nanorods with high aspect (length/width) ratios were obtained by using stoichiometric excesses of Hg (i.e., [Hg]/[Te] molar ratios greater than one) and relatively low reaction temperatures, as low as room temperature. The size-tunable optical cutoff wavelengths of the detectors ranged from 2 to 3.5 μm, with specific detectivities as high as 2.4 × 10<sup>11</sup> Jones. The devices retained their responsivity for more than a year. Branched nanorods of HgTe are promising materials for IR photodetectors and imagers.

ACS NanoVol. 19(25)
Sivananthan Laboratories (United States) (US), The University of Texas at Austin (US), Hongik University (KR)
Welch Foundation, Division of Industrial Innovation and Partnerships
Openalex Percentile: Top 88%
Advanced Semiconductor Detectors and Materials
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