Dynamic buckling of Si tetramers on the Si(111)-7 × 7 surface
The atomic structure of Si tetramers that form on the Si(111)-7 × 7 surface during homoepitaxy is investigated by means of first-principles calculations with the currently available atomistic model as a starting point. It is demonstrated that the rectangular shape of the Si tetramer is unstable against buckling. The comparison of the calculated results with the available scanning tunneling microscopy (STM) data provides a new understanding of the problem, indicating that the recorded STM images are influenced by dynamic buckling.
Authors
- R. A. Zhachuk (ORCID: https://orcid.org/0000-0001-6202-6271)
- José Coutinho (ORCID: https://orcid.org/0000-0003-0280-366X)
- D. V. Sheglov
Institutions
- Institute of Semiconductor Physics (RU)
- University of Aveiro (PT)
Publication Details
- Journal
- The Journal of Chemical Physics
- Published
- 2025-06-17
- DOI
- https://doi.org/10.1063/5.0273497
- Citations
- 1
- Primary Topic
- Surface and Thin Film Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 1.25
Funders
- Russian Science Foundation
- Fundação para a Ciência e a Tecnologia