Correlation Between Irradiation-Induced Trap and Lifetime Performance of Pulsed Capacitor After Gamma Irradiation

In the aerospace field, a metalized film capacitor (MFC) needs to work for a long time in an irradiation environment as an important component of the electrical system. To ensure its reliable operation under gamma irradiation, it is necessary to investigate the changes in irradiated MFC lifetime. In this article, the MFC lifetime was studied under different total irradiation doses from 0 to 1000 kGy. Then, the correlation analysis between MFC lifetime and the trap parameters after gamma irradiation was analyzed. The results showed that the capacitor lifetime had a tendency to increase with the increase of total irradiation dose in the initial stage. When the total irradiation dose was too high, the capacitor lifetime gradually decreased due to accelerated deterioration of dielectric. Theoretical analysis showed that the space charge effect caused by deep and shallow traps introduced by gamma irradiation was the fundamental reason for the trend to first increase and then decrease of capacitor lifetime.