Hard x-ray photoemission study of bulk single-crystalline InGaZnO4

We performed hard x-ray photoemission spectroscopy experiments of bulk InGaZnO4 (IGZO-11) single crystals, which were recently synthesized via the optical floating zone method, in order to reveal the bulk intrinsic electronic structure. We find that oxygen vacancies are preferentially located around In atoms in as-grown crystals, which are filled out by post-annealing in an oxygen atmosphere. We also find the presence of intrinsic hydroxy bonds, which persists even after oxygen annealing. The subgap states near the conduction-band minimum were clearly observed only in the as-grown crystals, while the subgap states near the valence-band maximum (VBM) were much weaker than those in the previous study even without oxygen annealing. The absence of the near-VBM subgap states in our single crystals suggests that in addition to oxygen vacancies, the loss of crystallinity is also relevant to the formation of the near-VBM subgap states.

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Publication Details

Journal
Applied Physics Letters
Published
2025-06-16
DOI
https://doi.org/10.1063/5.0271655
Primary Topic
Thin-Film Transistor Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

Hard x-ray photoemission study of bulk single-crystalline InGaZnO4

Naoki Kase, Goro Shibata, Yusuke Kawamura, Mario Okawa et al.
Applied Physics Letters
Thin-Film Transistor Technologies
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Hard x-ray photoemission study of bulk single-crystalline InGaZnO4

Naoki Kase, Goro Shibata, Yusuke Kawamura, Mario Okawa, Akira Yasui, Yasumasa Takagi, T. Saitoh, N. Miyakawa, Yunosuke Takahashi, Noriaki Hamada
article en

Abstract

We performed hard x-ray photoemission spectroscopy experiments of bulk InGaZnO4 (IGZO-11) single crystals, which were recently synthesized via the optical floating zone method, in order to reveal the bulk intrinsic electronic structure. We find that oxygen vacancies are preferentially located around In atoms in as-grown crystals, which are filled out by post-annealing in an oxygen atmosphere. We also find the presence of intrinsic hydroxy bonds, which persists even after oxygen annealing. The subgap states near the conduction-band minimum were clearly observed only in the as-grown crystals, while the subgap states near the valence-band maximum (VBM) were much weaker than those in the previous study even without oxygen annealing. The absence of the near-VBM subgap states in our single crystals suggests that in addition to oxygen vacancies, the loss of crystallinity is also relevant to the formation of the near-VBM subgap states.

Applied Physics LettersVol. 126(24)
Japan Atomic Energy Agency (JP), Tokyo University of Science (JP), Japan Synchrotron Radiation Research Institute (JP), The University of Tokyo (JP), The University of Osaka (JP)
Japan Society for the Promotion of Science
Openalex Percentile: Top 88%
Thin-Film Transistor Technologies
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