Forecasting the Remaining Useful Life (RUL) of Metallized Film Capacitors Affected by the Self-Healing Phenomenon
Metallized film capacitors are often responsible for failures in electronic systems. Predicting their lifetime to anticipate such failures is vital for assessing the reliability of these systems. This study presents accelerated aging tests involving voltage and temperature on 27 capacitors. The aim is to enhance the existing database and analyze the behavior of the resulting curves. A post-mortem analysis is carried out to evaluate the failure mechanisms. Based on this analysis, a new model is introduced. This model is evaluated against the data and compared with current laws in the literature and functions describing the experimental curves. The results confirm the model’s effectiveness, and its predictive capability is discussed.
Authors
- Miaoxin Wang (ORCID: https://orcid.org/0009-0003-1661-2319)
- Radoslava Mitova (ORCID: https://orcid.org/0000-0001-7876-4615)
- Pascal Venet (ORCID: https://orcid.org/0000-0002-2235-178X)
- Ali Sarı (ORCID: https://orcid.org/0000-0003-4446-7748)
- Claire Rochefort (ORCID: https://orcid.org/0009-0004-9989-3167)
- Guy Clerc (ORCID: https://orcid.org/0000-0001-7202-056X)
Institutions
- Université Claude Bernard Lyon 1 (FR)
- École Centrale de Lyon (FR)
- Centre National de la Recherche Scientifique (FR)
- Schneider Electric (France) (FR)
- Laboratoire Ampère (FR)
- Institut National des Sciences Appliquées de Lyon (FR)
Publication Details
- Journal
- IEEE Transactions on Dielectrics and Electrical Insulation
- Published
- 2025-06-16
- DOI
- https://doi.org/10.1109/tdei.2025.3579739
- Primary Topic
- Power Transformer Diagnostics and Insulation
- Type
- article
- Field-Weighted Citation Impact
- 0.00