Analysis of Switching Characteristics of TO-247-3L and TO-247-4L SiC MOSFETs Based on Chip Size and Temperature Variations
Silicon-Carbide Metal-Oxide-Semiconductor Field-Effect Transistors (SiC MOSFETs) are crucial for next-generation power conversion. Conventional SiC MOSFETs primarily utilize a 3-lead package, which is simple in structure and cost-effective. However, the common source inductance of the package increases switching losses. To address this issue, a 4-lead package has been introduced. Nevertheless, research on its switching characteristics is still limited. This study compares the switching characteristics of TO-247-3L and TO-247-4L SiC MOSFETs with identical chip sizes through double pulse tests. Moreover, switching losses under different temperature conditions were analyzed for various chip sizes of TO-247-3L and TO-247-4L SiC MOSFETs. The findings indicate that switching losses of TO-247-4L SiC MOSFETs were lower than TO-247-3L SiC MOSFETs. Additionally, turn-off energy losses increased with temperature, while turn-on energy losses varied depending on chip sizes and package types.
Authors
- Jungkyo Jung (ORCID: https://orcid.org/0000-0001-6037-8839)
- Hyun-Yong Park
- Hye-Min Kang (ORCID: https://orcid.org/0000-0001-9073-5833)
- Yong‐Jin Seo (ORCID: https://orcid.org/0009-0007-7334-4284)
- Sung-Min Choi
Publication Details
- Journal
- The Transactions of The Korean Institute of Electrical Engineers
- Published
- 2025-05-31
- DOI
- https://doi.org/10.5370/kiee.2025.74.5.917
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00