Decoding the interfering L-lines by artificial neural network-based modeling for direct analysis of lanthanides in water samples using total reflection X-ray fluorescence spectrometry
An Artificial Neural Network (ANN)-based methodology for the direct analysis of lanthanides using their highly interfering L-lines as characteristic signatures using total reflection X-ray fluorescence spectroscopy has been demonstrated.
Authors
- Kaushik Sanyal
- Buddhadev Kanrar (ORCID: https://orcid.org/0000-0001-5662-5921)
- Rajesh V. Pai (ORCID: https://orcid.org/0000-0002-9258-2751)
Institutions
- Bhabha Atomic Research Centre (IN)
- Homi Bhabha National Institute (IN)
Publication Details
- Journal
- Journal of Analytical Atomic Spectrometry
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d4ja00449c
- Citations
- 2
- Primary Topic
- Medical Imaging Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 2.72