1kb IGZO TFT Based Flexible SRAM for IoT Applications
We present a 1-kbit Static Random Access Memory (SRAM) using 600nm thin-film Indium Gallium Zinc Oxide (IGZO) technology from Pragmatic Semiconductor. This memory is designed for low-cost bendable applications that require flexible microprocessors. Operating at a low supply voltage of 1.6V, the SRAM cell achieves a Static Noise Margin (SNM) of 405 mV and consumes an average static power of 1.94 µW. The effective cell area is only 29.5µm x 31.75µm, making it the smallest reported for flexible SRAM. The memory array covers an area of 2.26 mm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> and has a power consumption of 3.9 mW. The read and write access times are 1110 ns and 330 ns, respectively.
Authors
- Mohit Dandekar (ORCID: https://orcid.org/0000-0002-8713-0945)
- Jelle Biesmans (ORCID: https://orcid.org/0000-0003-0653-1956)
- Kris Myny (ORCID: https://orcid.org/0000-0002-5230-495X)
- Wim Dehaene (ORCID: https://orcid.org/0000-0002-6792-7965)
- Djihad Nacereddine Bouakaz
Institutions
- KU Leuven (BE)
Publication Details
- Published
- 2025-05-18
- DOI
- https://doi.org/10.1109/imw61990.2025.11026949
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00