Supplementary Material for “Utilization of Complexity to Quantify the Regularity and Stochasticity of Nanocrystal Structure”

Power spectral density (PSD) is a common measure used in structural analysis.It is calculated based on Fourier transformation.The Lorentz correction method can be used to accurately conrm the peak position of PSD.It calculates q 2 I and plots the curve of q 2 I with respect to q.As shown in Fig. S2b, the peaks of CsPbBr 3 at -140 C and CsPbBr 3 at -180 C were 0.501 and 0.140, respectively.

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Publication Details

Journal
Acta Physica Polonica A
Published
2025-05-01
DOI
https://doi.org/10.12693/aphyspola.147.422.s1
Citations
2
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
1.04
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article

Supplementary Material for “Utilization of Complexity to Quantify the Regularity and Stochasticity of Nanocrystal Structure”

Qian Guo, Bowen Song, Fei Xie, Ming Xie et al.
2 citations
Acta Physica Polonica A
X-ray Diffraction in Crystallography
1.04
article

Supplementary Material for “Utilization of Complexity to Quantify the Regularity and Stochasticity of Nanocrystal Structure”

Qian Guo, Bowen Song, Fei Xie, Ming Xie, Xiaomin Jiao
article en
2 citations

Abstract

Power spectral density (PSD) is a common measure used in structural analysis.It is calculated based on Fourier transformation.The Lorentz correction method can be used to accurately conrm the peak position of PSD.It calculates q 2 I and plots the curve of q 2 I with respect to q.As shown in Fig. S2b, the peaks of CsPbBr 3 at -140 C and CsPbBr 3 at -180 C were 0.501 and 0.140, respectively.

Acta Physica Polonica AVol. 147(5)
University of Science and Technology of China (CN), National Synchrotron Radiation Laboratory (CN)
Openalex Percentile: Top 25%
X-ray Diffraction in Crystallography
1.04
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