1,000,000 On/Off Ratio in Sub-1 nm Channel Length Carbon Nanotube/Monolayer MoS<sub>2</sub>/Carbon Nanotube Vertical Transistors
Vertical field effect transistors (VFETs) using graphene and transition metal dichalcogenide (TMD) heterostructures are promising for downsizing the channel length to a monolayer TMD thickness of 0.65 nm. However, graphene/monolayer TMD/metal VFETs struggle with a low on/off ratio due to gate field screening by the graphene layer and a high off-state tunneling current caused by the large contact area. Here, we propose a 0.65 nm channel length VFET with a very high on/off current ratio made by cross-stacking top and bottom carbon nanotubes (CNTs) with a monolayer TMD in between. The ultranarrow junction area in the CNT/monolayer TMD/CNT VFET can significantly reduce the off-state tunneling current. Additionally, the gate field is transmitted from the sidewall of the bottom CNT to the monolayer MoS<sub>2</sub> vertical channel between the two CNTs without field screening, achieving very strong gate modulation. As a result, our devices exhibit about 10<sup>5</sup> times higher on/off ratio (a maximum of 10<sup>6</sup>), 10<sup>5</sup> times lower off current (10<sup>-13</sup> A), and 560 times lower subthreshold swing (SS) (125 mV dec<sup>-1</sup>) compared to graphene/monolayer TMD/metal VFETs. In the comparison between multilayer MoS<sub>2</sub> and monolayer MoS<sub>2</sub> VFETs, rigid multilayer MoS<sub>2</sub> forms a large air gap at the multilayer MoS<sub>2</sub>/CNT/substrate, which reduces electric field transmission. In contrast, monolayer MoS<sub>2</sub> bends significantly along the sidewall of the CNT, resulting in minimal air gap formation and enhancing the electric field effect in the channel. As a result, the CNT/monolayer MoS<sub>2</sub>/CNT VFET shows a 10 times higher on-current saturation and on/off ratio compared to the CNT/multilayer MoS<sub>2</sub>/CNT VFET.
Authors
- Hai Phuong Duong
- Anthony Cabanillas (ORCID: https://orcid.org/0009-0002-0170-1899)
- Ngoc Thanh Duong
- Thanh Luan Phan (ORCID: https://orcid.org/0000-0002-2873-8176)
- Seong Chu Lim (ORCID: https://orcid.org/0000-0002-0751-1458)
- Dinh Phuc (ORCID: https://orcid.org/0000-0001-5325-8660)
- Huamin Li (ORCID: https://orcid.org/0000-0001-7093-4835)
- Vu Khac Dat
- Văn Tú Vũ (ORCID: https://orcid.org/0000-0002-4425-7604)
- Minh Chien Nguyen (ORCID: https://orcid.org/0009-0001-6991-3591)
- Woo Jong Yu (ORCID: https://orcid.org/0000-0002-7399-307X)
- Huang Yun
- Van Dam
Institutions
- University at Buffalo, State University of New York (US)
- Sungkyunkwan University (KR)
Publication Details
- Journal
- ACS Nano
- Published
- 2025-06-11
- DOI
- https://doi.org/10.1021/acsnano.5c04746
- Citations
- 3
- Primary Topic
- Graphene research and applications
- Type
- article
- Field-Weighted Citation Impact
- 1.55
Funders
- Ministry of Trade, Industry and Energy
- Korea Institute for Advancement of Technology
- National Research Foundation of Korea
- Samsung