Efficient Design and Functional Testing of a 32-Bit RISC Processor in Verilog
This paper presents, a 32-bit Reduced Instruction Set Computer (RISC) processor has been implemented and simulated in Verilog through the focus on cost, simplicity and scalability. The architecture of its processor grants a lean, yet strong instruction set that supports very simple activities with maximum minimal overhead. An efficient Arithmetic Logic Unit (ALU) is central to its operation and is used to seamlessly execute basic arithmetic and logical operations that ideally fit the instruction flow. The structure of Verilog simulator is used to simulate, and verify the processor using Verilog, and simulations have been performed to prove the correctness, precision and speed of calculations by the processor. The processor executes instructions with predictable high consistency and low latency and can therefore be applied to many applications. This implementation satisfies architectural optimization while providing the ability to be further optimized. In addition to the present form, this processor makes for a good foundation for future development. Some of them are instruction set extension, pipelining and raise in data throughput, as the processor becomes capable of more advanced computational processes. This work contributes to the growing field of processor design. The design is optimal for use in embedded systems, real time processing, and learning, and has a stable learning platform for development and learning in processor design with its scalable and efficient nature. This work provides an addition to the emerging field of RISC computing through the introduction of a low cost and flexible processor architecture and general insight into future research and development for processors.
Authors
- Manoj Kumar D
- K. Jayasri
- C Saravanakumar (ORCID: https://orcid.org/0000-0003-2505-1317)
- E Mohanakrishnan
- Jobitha Lakshmi J
Institutions
- SRM Institute of Science and Technology (IN)
Publication Details
- Published
- 2025-03-21
- DOI
- https://doi.org/10.1109/icsses64899.2025.11009267
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00