Single Event Effects (SEE), Laser, and Total Dose (TID) Testing for AFP1422 Flexible PWM Controller
This paper covers the Heavy Ion Single Event Effects (SEE), Laser, and Total Ionizing Dose (TID) testing completed on the AFP1422 Radiation Hardened PWM Controller. SEE testing included Single Event Transient (SET) testing up to an effective LET of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{4 0. 4 ~ M e V * c m 2 / m g. }$</tex> Laser testing was initially completed via topside exposure and later completed through the backside of the device using a beam with energy up to 1.5 nJ. TID testing was completed with bias conditions up to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$300 \text{krad}(\text{Si})$</tex>.
Authors
- Teresa Farris
- A. Ghoshal
- K. Schulmeyer
- J. Cortman
- C. Yots
Institutions
- Apogee Semiconductor (United States) (US)
Publication Details
- Published
- 2024-09-19
- DOI
- https://doi.org/10.1109/radecs61975.2024.11017563
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00