Single Event Effects (SEE), Laser, and Total Dose (TID) Testing for AFP1422 Flexible PWM Controller

This paper covers the Heavy Ion Single Event Effects (SEE), Laser, and Total Ionizing Dose (TID) testing completed on the AFP1422 Radiation Hardened PWM Controller. SEE testing included Single Event Transient (SET) testing up to an effective LET of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{4 0. 4 ~ M e V * c m 2 / m g. }$</tex> Laser testing was initially completed via topside exposure and later completed through the backside of the device using a beam with energy up to 1.5 nJ. TID testing was completed with bias conditions up to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$300 \text{krad}(\text{Si})$</tex>.

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Published
2024-09-19
DOI
https://doi.org/10.1109/radecs61975.2024.11017563
Primary Topic
Radiation Effects in Electronics
Type
article
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article

Single Event Effects (SEE), Laser, and Total Dose (TID) Testing for AFP1422 Flexible PWM Controller

Teresa Farris, A. Ghoshal, K. Schulmeyer, J. Cortman et al.
Radiation Effects in Electronics
article

Single Event Effects (SEE), Laser, and Total Dose (TID) Testing for AFP1422 Flexible PWM Controller

Teresa Farris, A. Ghoshal, K. Schulmeyer, J. Cortman, C. Yots
article en

Abstract

This paper covers the Heavy Ion Single Event Effects (SEE), Laser, and Total Ionizing Dose (TID) testing completed on the AFP1422 Radiation Hardened PWM Controller. SEE testing included Single Event Transient (SET) testing up to an effective LET of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{4 0. 4 ~ M e V * c m 2 / m g. }$</tex> Laser testing was initially completed via topside exposure and later completed through the backside of the device using a beam with energy up to 1.5 nJ. TID testing was completed with bias conditions up to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$300 \text{krad}(\text{Si})$</tex>.

Apogee Semiconductor (United States) (US)
Affordable and clean energy
Openalex Percentile: Top 72%
Radiation Effects in Electronics
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