Radiation Evaluation of the Texas Instruments TPS7H3014-SP Radiation Hardened Four-Channel Power-supply Sequencer

Single events effect (SEE) characterization and total ionizing dose (TID) results for the TPS7H3014-SP 14-V integrated four-channel sequencer are summarized, showing very powerful SEE performance up to LET<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EFF</inf>=75 MeV-cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/mg and excellent TID behavior.

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Publication Details

Published
2024-09-19
DOI
https://doi.org/10.1109/radecs61975.2024.11017532
Primary Topic
Radiation Effects in Electronics
Type
article
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article

Radiation Evaluation of the Texas Instruments TPS7H3014-SP Radiation Hardened Four-Channel Power-supply Sequencer

T. Lew, J. Nuttall, Saqib Khan, J. Cruz-Colon et al.
Radiation Effects in Electronics
article

Radiation Evaluation of the Texas Instruments TPS7H3014-SP Radiation Hardened Four-Channel Power-supply Sequencer

T. Lew, J. Nuttall, Saqib Khan, J. Cruz-Colon, A. Marinelarena
article en

Abstract

Single events effect (SEE) characterization and total ionizing dose (TID) results for the TPS7H3014-SP 14-V integrated four-channel sequencer are summarized, showing very powerful SEE performance up to LET<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EFF</inf>=75 MeV-cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/mg and excellent TID behavior.

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Radiation Evaluation of the Texas Instruments TPS7H3014-SP Radiation Hardened Four-Channel Power-supply Sequencer — T. Lew, J. Nuttall, et al. · (2024) | TGRS Research Map | TGRS