Three-Dimensional Reconstruction of Serial Block-Face Scanning Electron Microscopy Using Semantic Segmentation based on Semi-Supervised Deep Learning

Serial block-face scanning electron microscopy (SBF-SEM) is employed to achieve high-resolution volume reconstructions and detailed ultrastructural analyses of complex organelles. The performance of SBF-SEM is evaluated according to the accuracy of segmentation. Our study introduces a semi-supervised learning approach using a segment interpolation method to mitigate the costs of manual segmentation. The shapes and locations of individual segments between sparsely annotated label images are estimated using the proposed method. The proposed method is particularly well suited for SBF-SEM, where alignment and fine cutting of samples allow for accurate predictions with a minimal amount of labelled data. To validate the deep neural networks trained using the proposed method, the F-1 score metric and the K-fold technique were utilized. The results achieved an F-1 score of 0.89 for mouse brain cells and 0.84 for inverted images during the validation process for semi-supervised learning. Testing on an independently separated test dataset yielded scores of 0.84 for mouse brain cells and 0.80 for inverted cases. The automatically segmented results were then reconstructed in volume images using the marching cube algorithm. This allows for a three-dimensional (3-D) analysis of complex organelles, with potential applications in the fields of biology and medicine.

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Publication Details

Journal
Microscopy and Microanalysis
Published
2025-05-09
DOI
https://doi.org/10.1093/mam/ozaf047
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

Three-Dimensional Reconstruction of Serial Block-Face Scanning Electron Microscopy Using Semantic Segmentation based on Semi-Supervised Deep Learning

Hee‐Seok Kweon, Youngkwon Haam, Junhyeong Park, Dal‐Jae Yun et al.
Microscopy and Microanalysis
Advanced Electron Microscopy Techniques and Applications
article

Three-Dimensional Reconstruction of Serial Block-Face Scanning Electron Microscopy Using Semantic Segmentation based on Semi-Supervised Deep Learning

Hee‐Seok Kweon, Youngkwon Haam, Junhyeong Park, Dal‐Jae Yun, Hwan Hur, Ha Rim Lee, In-Yong Park, Jisoo Kim, Haewon Jung
article en

Abstract

Serial block-face scanning electron microscopy (SBF-SEM) is employed to achieve high-resolution volume reconstructions and detailed ultrastructural analyses of complex organelles. The performance of SBF-SEM is evaluated according to the accuracy of segmentation. Our study introduces a semi-supervised learning approach using a segment interpolation method to mitigate the costs of manual segmentation. The shapes and locations of individual segments between sparsely annotated label images are estimated using the proposed method. The proposed method is particularly well suited for SBF-SEM, where alignment and fine cutting of samples allow for accurate predictions with a minimal amount of labelled data. To validate the deep neural networks trained using the proposed method, the F-1 score metric and the K-fold technique were utilized. The results achieved an F-1 score of 0.89 for mouse brain cells and 0.84 for inverted images during the validation process for semi-supervised learning. Testing on an independently separated test dataset yielded scores of 0.84 for mouse brain cells and 0.80 for inverted cases. The automatically segmented results were then reconstructed in volume images using the marching cube algorithm. This allows for a three-dimensional (3-D) analysis of complex organelles, with potential applications in the fields of biology and medicine.

Microscopy and MicroanalysisVol. 31(3)
Chungnam National University (KR), Korea Research Institute of Standards and Science (KR), Korea Basic Science Institute (KR), Korea University of Science and Technology (KR)
Korea Research Institute of Standards and Science, Ministry of Science and ICT, South Korea, Commercializations Promotion Agency for R and D Outcomes
Openalex Percentile: Top 95%
Advanced Electron Microscopy Techniques and Applications
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