Radiation Induced Single Events and Cumulated Dose Effects on CMOS and InGaAs Image Sensors
This article presents irradiation tests performed by CNES on several SONY, AMS-OSRAM, TELEDYNE-E2V and PYXALIS commercial CMOS image sensors, as well as SONY InGaAs image sensors.
Authors
- Aubin Antonsanti (ORCID: https://orcid.org/0000-0003-1889-2759)
- Alexandre Le Roch (ORCID: https://orcid.org/0000-0002-2579-800X)
- Jean-Marc Belloir (ORCID: https://orcid.org/0000-0001-7323-456X)
- Vincent Goiffon (ORCID: https://orcid.org/0000-0001-5024-0115)
- Cédric Virmontois (ORCID: https://orcid.org/0000-0002-9348-1565)
- Alex Materne (ORCID: https://orcid.org/0000-0002-8625-8090)
- Clémentine Durnez (ORCID: https://orcid.org/0000-0003-4359-9909)
- Valérian Lalucaa (ORCID: https://orcid.org/0000-0003-4083-5363)
- Joanna Krynski (ORCID: https://orcid.org/0009-0009-7843-3782)
- Bernard Vincent (ORCID: https://orcid.org/0000-0002-6635-8174)
Institutions
- Institut Superieur de l'Aeronautique et de l'Espace (ISAE-SUPAERO) (FR)
- Centre National d'Études Spatiales (FR)
Publication Details
- Published
- 2024-09-19
- DOI
- https://doi.org/10.1109/radecs61975.2024.11017533
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.00