See Test Results of Critical Commercial-Off-The-Shelf (Cots) Electronic Components for a Low Earth Orbit Radiation Monitor
COTS electronic components intended for being used in the Home-Grown Radiation Monitor were tested under 15 MeV and 30 MeV proton irradiation at METU-DBL and with 60 MeV protons at UCLouvain CRC. The resulting single event effects (SEE) on the components and their analyses are presented
Authors
- Melahat Bilge Demirköz
- Uğur Kılıç (ORCID: https://orcid.org/0000-0003-4092-3785)
- M Arslan (ORCID: https://orcid.org/0000-0002-1549-6569)
- Hazal Düyen
- Samet Amanvermez
Institutions
- Middle East Technical University (TR)
Publication Details
- Published
- 2024-09-19
- DOI
- https://doi.org/10.1109/radecs61975.2024.11017570
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.00