Total Ionizing Dose Characterization of Advanced Latch-Up Current Limiter ASIC

This paper presents the results of the Total Ionizing Dose characterization of the Analog Current Control Loop implemented within the SKY-IC-RHLCL-A1 Latch-Up current limiter application-specific integrated circuit. Given the criticality of Single Event Latch-ups in satellite platforms, the use of safeguard circuits such as latching current limiters is essential. This work focuses on performance and resilience of the Analog Current Control Loop, which is responsible for the measurements of protected load current and current limitation in case of a Single Event Latch-up. The characterization results provide valuable insights into the behavior and reliability of the Latch-up current limiter under the irradiation exposure. Five out of six biased current limiters were able to function up to 40 krad(Si) of Total Ionizing Dose, whereas one experienced failure at 22 krad(Si) due to startup circuit failure. Beyond 40 krad(Si), the devices began to fail gradually, but regained functionality after the annealing process.