Single Event Upset Characterization of the Polarfire® SoC RISC-V Microprocessor SubSystem Using Proton Irradiation

The proton induced SEU cross-section of the Polarfire® SoC RISC-V Microprocessor SubSystem is presented. Upset rate in the space radiation environment is estimated.

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Publication Details

Published
2024-09-19
DOI
https://doi.org/10.1109/radecs61975.2024.11017548
Primary Topic
Radiation Effects in Electronics
Type
article
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article

Single Event Upset Characterization of the Polarfire® SoC RISC-V Microprocessor SubSystem Using Proton Irradiation

Nan Hu, David M. Hiemstra
Radiation Effects in Electronics
article

Single Event Upset Characterization of the Polarfire® SoC RISC-V Microprocessor SubSystem Using Proton Irradiation

Nan Hu, David M. Hiemstra
article en

Abstract

The proton induced SEU cross-section of the Polarfire® SoC RISC-V Microprocessor SubSystem is presented. Upset rate in the space radiation environment is estimated.

Affordable and clean energy
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Radiation Effects in Electronics
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Single Event Upset Characterization of the Polarfire® SoC RISC-V Microprocessor SubSystem Using Proton Irradiation — Nan Hu, David M. Hiemstra · (2024) | TGRS Research Map | TGRS