Dose Rate Effects on Dynamic Operation of an 8-Bit Microcontroller
This work presents dose rate testing of an 8-bit microcontroller which executes code during radiation pulses. Multiple different failure modes are observed, which depend on the dose rate and integrated dose received by the device.
Authors
- Jeffrey Goeders (ORCID: https://orcid.org/0000-0002-9822-6926)
- Dolores Black (ORCID: https://orcid.org/0000-0002-5282-3506)
- David Michael Wood (ORCID: https://orcid.org/0000-0002-7826-7237)
- Jeffrey D. Black (ORCID: https://orcid.org/0000-0003-3058-7992)
- Mike Wirthlin
- V. Meyer
- Cameron Samson
Institutions
- Brigham Young University (US)
- Sandia National Laboratories (US)
- Brigham Young University - Idaho (US)
Publication Details
- Published
- 2024-09-19
- DOI
- https://doi.org/10.1109/radecs61975.2024.11017558
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00