SAMD21RT 32-Bits ARM Cortex-M0+ Microcontroller Single Event Effects & TID Evaluation

This paper reports the results of Single Event Effects (SEE) and Total Ionizing Dose (TID) test campaigns conducted by Microchip on the ARM® Cortex® M0+ SAMD21RT Microcontroller

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Publication Details

Published
2024-09-19
DOI
https://doi.org/10.1109/radecs61975.2024.11017531
Primary Topic
Radiation Effects in Electronics
Type
article
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article

SAMD21RT 32-Bits ARM Cortex-M0+ Microcontroller Single Event Effects & TID Evaluation

David Dangla, Florence Malou, Guillaume Bourg-Cazan, Sophie D'alberto et al.
Radiation Effects in Electronics
article

SAMD21RT 32-Bits ARM Cortex-M0+ Microcontroller Single Event Effects & TID Evaluation

David Dangla, Florence Malou, Guillaume Bourg-Cazan, Sophie D'alberto, Alexis Solère, Valentin Béranger
article en

Abstract

This paper reports the results of Single Event Effects (SEE) and Total Ionizing Dose (TID) test campaigns conducted by Microchip on the ARM® Cortex® M0+ SAMD21RT Microcontroller

Centre National d'Études Spatiales (FR)
Affordable and clean energy
Openalex Percentile: Top 72%
Radiation Effects in Electronics
DOISourceOpenAlex
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