Accurate determination of atomic displacement parameters for thermoelectric materials from synchrotron powder diffraction data with sophisticated background treatment

We show that analysis including first-order thermal diffuse scattering (TDS) improves the accuracy of atomic displacement parameters (ADPs) of Al and Ag 8 SnSe 6 determined by Rietveld analysis.

Authors

Seiya Takahashi
Eiji Nishibori (ORCID: https://orcid.org/0000-0002-4192-6577)

Institutions

University of Tsukuba (JP)

Publication Details

Journal: CrystEngComm
Published: 2025-01-01
DOI: https://doi.org/10.1039/d5ce00297d
Primary Topic: X-ray Diffraction in Crystallography
Type: article
Field-Weighted Citation Impact: 0.00

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article

Accurate determination of atomic displacement parameters for thermoelectric materials from synchrotron powder diffraction data with sophisticated background treatment

Seiya Takahashi, Eiji Nishibori

Jan 1, 2025

CrystEngComm

X-ray Diffraction in Crystallography

article

Accurate determination of atomic displacement parameters for thermoelectric materials from synchrotron powder diffraction data with sophisticated background treatment

Seiya Takahashi, Eiji Nishibori

January 1, 2025article en

Abstract

We show that analysis including first-order thermal diffuse scattering (TDS) improves the accuracy of atomic displacement parameters (ADPs) of Al and Ag 8 SnSe 6 determined by Rietveld analysis.

CrystEngCommVol. 27(29)

University of Tsukuba (JP)

Openalex Percentile: Top 91%

X-ray Diffraction in Crystallography

DOI Source OpenAlex

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Accurate determination of atomic displacement parameters for thermoelectric materials from synchrotron powder diffraction data with sophisticated background treatment — Seiya Takahashi, Eiji Nishibori · CrystEngComm (2025) | TGRS Research Map | TGRS