METHODOLOGY FOR VERIFYING THE CHIP AUTHENTICITY BASED ON DYNAMIC ENERGY CONSUMPTION ANALYSIS

In the conditions of restructuring and complication of logistic supply chains of EKB (Electronic Component Base) the risk of supplying counterfeit products increases significantly, which determines the relevance of the development of simple and cost-effective methods of input control. In this paper, a non-invasive method of chip authenticity control is proposed, based on the registration of temporary changes in the current consumption at the initial moment of the chip operation time, assuming that the form of the current consumption is determined by the internal structure of the chip, and analog parameters of the integrated semiconductor structures of each individual chip even within the same type-nominal. The commercial microcontroller STM32F107 and its binary compatible counterpart GD32F107 were chosen as the objects of study. For each sample 100 measurements of current consumption were made. The cosine similarity method was used to evaluate the correlation of the obtained measurements. The results showed that for multiple measurements of one STM32F107 sample, the mathematical expectation of correlation is 0.975, which confirms the high repeatability of the consumption current, and allows us to consider it as a characteristic response of this chip. When cross-analyzing 10 samples of STM32F107, the mathematical expectation of correlation reaches 0.802, which can serve as a reference value for authenticity evaluation. The applicability of this method in detecting mismatch with the binary-compatible GD32F107 chip was also demonstrated. In the case of cross correlation analysis of current consumption measurements of STM32F107 and GD32F107 sample, the mathematical expectation of correlation of -0.298 was demonstrated, which allows to conclude that the internal structure is significantly different. The obtained results are applicable to the detection of counterfeit integrated circuits both in the framework of large-scale production and in the creation of single samples of hardware.